Accession Number : ADA239767
Title : Dose Rate and Total Dose Radiation Testing of the Texas Instruments TMS320C30 32-Bit Floating Point Digital Signal Processor.
Descriptive Note : Final rept.,
Corporate Author : MITRE CORP BEDFORD MA
Personal Author(s) : Siy, P. F. ; Carter, J. T. ; D'Addario, L. R. ; Loeber, D. A.
Report Date : AUG 1991
Pagination or Media Count : 28
Abstract : The MITRE Corporation has performed in-flux radiation testing of the Texas Instruments TMS320C30 32-bit floating point digital signal processor in both total dose and dose rate radiation environments. This test effort has provided data relating to the applicability of the TMS320C30 in systems with total dose and/or dose rate survivability requirements. In order to accomplish these tests, the MITRE Corporation developed custom hardware and software for in-flux radiation testing. This paper summarizes the effort by providing an overview of the TMS320C30, MITRE's test methodology, test facilities, statistical analysis, and full coverage of the test results. (Author)
Descriptors : *SIGNAL PROCESSING , *TEST AND EVALUATION , RADIATION , RADIATION DOSAGE , SURVIVABILITY , TEST METHODS , STATISTICAL ANALYSIS , DOSE RATE , TEST FACILITIES , REQUIREMENTS , COMPUTER PROGRAMS , ENVIRONMENTS
Subject Categories : COMPUTER HARDWARE
Distribution Statement : APPROVED FOR PUBLIC RELEASE